Polymer Characterization with the Atomic Force Microscope

نویسندگان

  • U. Maver
  • T. Maver
  • Z. Peršin
  • M. Mozetič
  • A. Vesel
چکیده

Atomic force microscopy is a powerful characterization tool for polymer science, capable of revealing surface structures with superior spatial resolution [1]. The universal character of repulsive forces between the tip and the sample, which are employed for surface analysis in AFM, enables examination of even single polymer molecules without disturbance of their integrity [2]. Being initially developed as the analogue of scanning tunneling microscopy (STM) for the high-resolution profiling of non-conducting surfaces, AFM has developed into a multifunctional technique suitable for characterization of topography, adhesion, mechanical, and other properties on scales from tens of microns to nanometers [3].

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تاریخ انتشار 2013